Struct stm32wlxx_hal::pac::exti::RegisterBlock
#[repr(C)]pub struct RegisterBlock {Show 16 fields
pub rtsr1: Reg<RTSR1_SPEC>,
pub ftsr1: Reg<FTSR1_SPEC>,
pub swier1: Reg<SWIER1_SPEC>,
pub pr1: Reg<PR1_SPEC>,
pub rtsr2: Reg<RTSR2_SPEC>,
pub ftsr2: Reg<FTSR2_SPEC>,
pub swier2: Reg<SWIER2_SPEC>,
pub pr2: Reg<PR2_SPEC>,
pub c1imr1: Reg<C1IMR1_SPEC>,
pub c1emr1: Reg<C1EMR1_SPEC>,
pub c1imr2: Reg<C1IMR2_SPEC>,
pub c1emr2: Reg<C1EMR2_SPEC>,
pub c2imr1: Reg<C2IMR1_SPEC>,
pub c2emr1: Reg<C2EMR1_SPEC>,
pub c2imr2: Reg<C2IMR2_SPEC>,
pub c2emr2: Reg<C2EMR2_SPEC>,
/* private fields */
}
Available on crate feature
stm32wl5x_cm4
only.Expand description
Register block
Fields§
§rtsr1: Reg<RTSR1_SPEC>
0x00 - rising trigger selection register
ftsr1: Reg<FTSR1_SPEC>
0x04 - falling trigger selection register
swier1: Reg<SWIER1_SPEC>
0x08 - software interrupt event register
pr1: Reg<PR1_SPEC>
0x0c - EXTI pending register
rtsr2: Reg<RTSR2_SPEC>
0x20 - rising trigger selection register
ftsr2: Reg<FTSR2_SPEC>
0x24 - falling trigger selection register
swier2: Reg<SWIER2_SPEC>
0x28 - software interrupt event register
pr2: Reg<PR2_SPEC>
0x2c - pending register
c1imr1: Reg<C1IMR1_SPEC>
0x80 - interrupt mask register
c1emr1: Reg<C1EMR1_SPEC>
0x84 - event mask register
c1imr2: Reg<C1IMR2_SPEC>
0x90 - wakeup with interrupt mask register
c1emr2: Reg<C1EMR2_SPEC>
0x94 - wakeup with event mask register
c2imr1: Reg<C2IMR1_SPEC>
0xc0 - interrupt mask register
c2emr1: Reg<C2EMR1_SPEC>
0xc4 - event mask register
c2imr2: Reg<C2IMR2_SPEC>
0xd0 - wakeup with interrupt mask register
c2emr2: Reg<C2EMR2_SPEC>
0xd4 - wakeup with event mask register
Auto Trait Implementations§
impl !RefUnwindSafe for RegisterBlock
impl Send for RegisterBlock
impl !Sync for RegisterBlock
impl Unpin for RegisterBlock
impl UnwindSafe for RegisterBlock
Blanket Implementations§
source§impl<T> BorrowMut<T> for Twhere
T: ?Sized,
impl<T> BorrowMut<T> for Twhere T: ?Sized,
source§fn borrow_mut(&mut self) -> &mut T
fn borrow_mut(&mut self) -> &mut T
Mutably borrows from an owned value. Read more